Invention Grant
- Patent Title: Ultrapure colloidal silica for use in chemical mechanical polishing applications
- Patent Title (中): 超纯胶体二氧化硅用于化学机械抛光应用
-
Application No.: US11526132Application Date: 2006-09-22
-
Publication No.: US08211193B2Publication Date: 2012-07-03
- Inventor: Deepak Mahulikar , Yuhu Wang , Ken A. Delbridge , Gert R. M. Moyaerts , Saeed H. Mohseni , Nichole R. Koontz , Bin Hu , Liqing Wen
- Applicant: Deepak Mahulikar , Yuhu Wang , Ken A. Delbridge , Gert R. M. Moyaerts , Saeed H. Mohseni , Nichole R. Koontz , Bin Hu , Liqing Wen
- Applicant Address: US MI Adrian
- Assignee: Fujifilm Planar Solutions, LLC
- Current Assignee: Fujifilm Planar Solutions, LLC
- Current Assignee Address: US MI Adrian
- Agency: Ohlandt, Greeley, Ruggiero & Perle, LLP
- Main IPC: B24D3/02
- IPC: B24D3/02 ; C09C1/68 ; C09K3/14 ; C09K13/00 ; C09K13/02 ; B24B1/00 ; C01B33/12 ; C03C15/00 ; C03C25/68

Abstract:
A method of chemical mechanical polishing a surface of a substrate including the step of: contacting the substrate and a composition including a plurality of colloidal silica particles having less than 200 ppb of each trace metal impurity, excluding potassium and sodium, have less than 2 ppm residual alcohol and wherein the cumulative concentration of the trace metal, excluding potassium and sodium, is in the range from about 0.5 to about 5 ppm; and a medium for suspending the particles; wherein the composition is an ultrapure colloidal silica dispersion; and wherein the contacting is carried out at a temperature and for a period of time sufficient to planarize the substrate.
Public/Granted literature
- US20070075292A1 Ultrapure colloidal silica for use in chemical mechanical polishing applications Public/Granted day:2007-04-05
Information query