发明授权
- 专利标题: Semiconductor device
- 专利标题(中): 半导体器件
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申请号: US13022611申请日: 2011-02-07
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公开(公告)号: US08212310B2公开(公告)日: 2012-07-03
- 发明人: Tomoko Matsudai , Norio Yasuhara , Kazutoshi Nakamura
- 申请人: Tomoko Matsudai , Norio Yasuhara , Kazutoshi Nakamura
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Patterson & Sheridan, LLP
- 优先权: JP2008-178748 20080709
- 主分类号: H01L29/76
- IPC分类号: H01L29/76 ; H01L29/94 ; H01L31/062 ; H01L31/113 ; H01L31/119
摘要:
A semiconductor device includes a semiconductor layer of a first conductivity type; a deep well of a second conductivity type formed in a portion of an upper layer portion of the semiconductor layer; a well of the first conductivity type formed in a portion of an upper layer portion of the deep well; a source layer of the second conductivity type formed in the well; a drain layer of the second conductivity type formed in the well apart from the source layer; and a contact layer of the second conductivity type formed outside the well in an upper layer portion of the deep well and connected to the drain layer. The drain layer is electrically connected to the deep well via the well by applying a driving voltage between the source layer and the drain layer.
公开/授权文献
- US20110133818A1 SEMICONDUCTOR DEVICE 公开/授权日:2011-06-09
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