发明授权
US08217441B2 Semiconductor constructions including gate arrays formed on partial SOI substrate
有权
包括在部分SOI衬底上形成的栅极阵列的半导体结构
- 专利标题: Semiconductor constructions including gate arrays formed on partial SOI substrate
- 专利标题(中): 包括在部分SOI衬底上形成的栅极阵列的半导体结构
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申请号: US12186726申请日: 2008-08-06
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公开(公告)号: US08217441B2公开(公告)日: 2012-07-10
- 发明人: Mark Fischer
- 申请人: Mark Fischer
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Wells St. John.P.S.
- 主分类号: H01L27/108
- IPC分类号: H01L27/108 ; H01L21/94 ; H01L21/336
摘要:
The invention includes methods for utilizing partial silicon-on-insulator (SOI) technology in combination with fin field effect transistor (finFET) technology to form transistors particularly suitable for utilization in dynamic random access memory (DRAM) arrays. The invention also includes DRAM arrays having low rates of refresh. Additionally, the invention includes semiconductor constructions containing transistors with horizontally-opposing source/drain regions and channel regions between the source/drain regions. The transistors can include gates that encircle at least three-fourths of at least portions of the channel regions, and in some aspects can include gates that encircle substantially an entirety of at least portions of the channel regions.
公开/授权文献
- US20090194802A1 Semiconductor Constructions, and DRAM Arrays 公开/授权日:2009-08-06
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