发明授权
- 专利标题: ADC calibration
- 专利标题(中): ADC校准
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申请号: US12844150申请日: 2010-07-27
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公开(公告)号: US08223047B2公开(公告)日: 2012-07-17
- 发明人: Fang-Shi Jordan Lai , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng , Yung-Fu Lin
- 申请人: Fang-Shi Jordan Lai , Kuo-Ming Wang , Hsu-Feng Hsueh , Cheng Yen Weng , Yung-Fu Lin
- 申请人地址: TW
- 专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人: Taiwan Semiconductor Manufacturing Company, Ltd.
- 当前专利权人地址: TW
- 代理机构: Lowe Hauptman Ham & Berner, LLP
- 主分类号: H03M1/10
- IPC分类号: H03M1/10
摘要:
An analog to digital convertor (ADC) includes a plurality of comparators one of which is referred to as an auxiliary comparator (e.g., comparator “Aux”). This comparator Aux is calibrated in the background while other comparators function as usual. Once having been calibrated, the comparator Aux replaces a first comparator, which becomes a new comparator Aux, is calibrated, and replaces the second comparator. This second comparator becomes the new comparator Aux, is calibrated, and replaces the third comparator, etc., until all comparators are calibrated. In effect, at any one point in time, a comparator may be calibrated as desire while other comparators and thus the ADC are operating as usual.
公开/授权文献
- US20110037632A1 ADC CALIBRATION 公开/授权日:2011-02-17