- 专利标题： High reliability surveillance and/or identification tag/devices and methods of making and using the same
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申请号： US12249735申请日： 2008-10-10
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公开(公告)号： US08227320B2公开(公告)日： 2012-07-24
- 发明人: Vivek Subramanian , Patrick Smith , Vikram Pavate , Arvind Kamath , Criswell Choi , Aditi Chandra , James Montague Cleeves
- 申请人： Vivek Subramanian , Patrick Smith , Vikram Pavate , Arvind Kamath , Criswell Choi , Aditi Chandra , James Montague Cleeves
- 申请人地址： US CA San Jose
- 专利权人： Kovio, Inc.
- 当前专利权人： Kovio, Inc.
- 当前专利权人地址： US CA San Jose
- 代理机构： The Law Offices of Andrew D. Fortney, P.C.
- 代理商 Andrew D. Fortney; Ryan S. Dunning
- 主分类号： H01L21/20
- IPC分类号： H01L21/20
摘要：
The present invention relates to methods of making capacitors for use in surveillance/identification tags or devices, and methods of using such surveillance/identification devices. The capacitors manufactured according to the methods of the present invention and used in the surveillance/identification devices described herein comprise printed conductive and dielectric layers. The methods and devices of the present invention improve the manufacturing tolerances associated with conventional metal-plastic-metal capacitor, as well as the deactivation reliability of the capacitor used in a surveillance/identification tag or device.
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