Invention Grant
- Patent Title: All-digital phase-locked loop, loop bandwidth calibration method, and loop gain calibration method for the same
- Patent Title (中): 全数字锁相环,环路带宽校准方法和环路增益校准方法相同
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Application No.: US12838502Application Date: 2010-07-19
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Publication No.: US08228128B2Publication Date: 2012-07-24
- Inventor: Hsiang-Hui Chang , Ping-Ying Wang , Jing-Hong Conan Zhan , Bing-Yu Hsieh
- Applicant: Hsiang-Hui Chang , Ping-Ying Wang , Jing-Hong Conan Zhan , Bing-Yu Hsieh
- Applicant Address: TW Science-Based Industrial Park, Hsin-Chu
- Assignee: Mediatek Inc.
- Current Assignee: Mediatek Inc.
- Current Assignee Address: TW Science-Based Industrial Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Main IPC: H03L7/085
- IPC: H03L7/085

Abstract:
For decreasing errors within an analog phase-locked loop, an all-digital phase-locked loop (ADPLL) with digital components and digital operations is used. The ADPLL may also be used for direct frequency modulation (DFM). By defining a proportional path gain of an ADPLL by a bandwidth and a reference frequency of the ADPLL, by a TDC gain, a DCO gain, a dividing ratio of a frequency divider, a gain of an amplifier or a combination thereof, the gain of the amplifier may be adjusted so that an optimal loop bandwidth of the ADPLL may be well calibrated. For achieving the aim of entirely digital of the ADPLL, the gains of the TDC and the DCO may be further adjusted in a digital manner.
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