发明授权
US08248595B2 Laser-based maintenance apparatus for inspecting flaws based on a generated surface wave
有权
基于激光的维护装置,用于基于生成的表面波检查缺陷
- 专利标题: Laser-based maintenance apparatus for inspecting flaws based on a generated surface wave
- 专利标题(中): 基于激光的维护装置,用于基于生成的表面波检查缺陷
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申请号: US13236322申请日: 2011-09-19
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公开(公告)号: US08248595B2公开(公告)日: 2012-08-21
- 发明人: Makoto Ochiai , Takahiro Miura , Hidehiko Kuroda , Fukashi Osakata , Satoshi Yamamoto , Kentaro Tsuchihashi , Masahiro Yoshida , Akira Tsuyuki
- 申请人: Makoto Ochiai , Takahiro Miura , Hidehiko Kuroda , Fukashi Osakata , Satoshi Yamamoto , Kentaro Tsuchihashi , Masahiro Yoshida , Akira Tsuyuki
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P.
- 优先权: JP2005-199465 20050707; JP2005-199466 20050707; JP2005-199467 20050707; JP2005-199469 20050707; JP2005-199472 20050707; JP2005-228801 20050707; JP2006-052255 20060228
- 主分类号: G01N21/00
- IPC分类号: G01N21/00
摘要:
A surface inspecting method including irradiating a laser light to a test object to generate an ultrasonic wave, irradiating a second laser light at a position apart by a known distance from a position where the laser light is irradiated and receiving a reflection light thereof, and correcting a generation surface wave of a received ultrasonic wave by using an ultrasonic wave other than the generation surface wave to thereby detect a flaw of the test object. A characterization of the generation surface wave is divided or integrated by the same characterization of the ultrasonic wave other than the generation surface wave included in an output signal to obtain a performance index value and obtain a depth of the flaw by applying the performance index value to a calibration curve in which a corresponding relation between the performance index value and the depth of the flaw is obtained preliminarily.
公开/授权文献
- US20120048021A1 LASER-BASED MAINTENANCE APPARATUS FOR INSPECTING FLAWS 公开/授权日:2012-03-01
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