发明授权
US08250289B2 Phase-change random access memory and method of setting boot block therein
有权
相变随机存取存储器及其中设置引导块的方法
- 专利标题: Phase-change random access memory and method of setting boot block therein
- 专利标题(中): 相变随机存取存储器及其中设置引导块的方法
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申请号: US12402006申请日: 2009-03-11
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公开(公告)号: US08250289B2公开(公告)日: 2012-08-21
- 发明人: Yu-hwan Ro , Kwang-ho Kim , Kwang-jin Lee , Joon-yong Choi
- 申请人: Yu-hwan Ro , Kwang-ho Kim , Kwang-jin Lee , Joon-yong Choi
- 申请人地址: KR Suwon-Si
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-Si
- 代理机构: F. Chau & Associates, LLC
- 优先权: KR10-2008-0023470 20080313
- 主分类号: G06F12/00
- IPC分类号: G06F12/00 ; G06F12/02
摘要:
A semiconductor memory device includes a memory cell array and the memory cell array includes: a plurality of memory blocks and at least one setting unit. The at least one setting unit stores a location and a size of a boot data storage region within the plurality of memory blocks that stores boot data. The at least one setting units may include a register for setting usage of each memory block as a boot block. The semiconductor device may be a phase-change memory.
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