Invention Grant
US08264250B2 Array substrate having increased inspection efficiency and display apparatus having the same
有权
具有提高的检查效率的阵列基板和具有其的显示装置
- Patent Title: Array substrate having increased inspection efficiency and display apparatus having the same
- Patent Title (中): 具有提高的检查效率的阵列基板和具有其的显示装置
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Application No.: US12560699Application Date: 2009-09-16
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Publication No.: US08264250B2Publication Date: 2012-09-11
- Inventor: Sung-Man Kim , Myung-Koo Hur , Beom-Jun Kim , Seong-Young Lee
- Applicant: Sung-Man Kim , Myung-Koo Hur , Beom-Jun Kim , Seong-Young Lee
- Applicant Address: KR
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR2004-85462 20041025; KR2004-108854 20041220
- Main IPC: G01R31/26
- IPC: G01R31/26

Abstract:
In an array substrate and a display apparatus, a pixel part has a plurality of gate lines, a plurality of data lines, and a plurality of pixels electrically connected to the gate and data lines. A driving circuit drives the pixel part electrically connected to a first end of the gate lines. An inspection circuit is electrically connected to a second end of the gate lines, and inspects the pixel part in response to an inspection signal externally provided. Thus, positions and causes for defects of the pixel part may be accurately detected, thereby improving inspecting efficiency.
Public/Granted literature
- US20100001756A1 ARRAY SUBSTRATE HAVING INCREASED INSPECTION EFFICINCY AND DISPLAY APPARATUS HAVING THE SAME Public/Granted day:2010-01-07
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