Invention Grant
- Patent Title: Methods for atomic layer deposition of hafnium-containing high-K dielectric materials
- Patent Title (中): 含铪高K介电材料的原子层沉积方法
-
Application No.: US11925681Application Date: 2007-10-26
-
Publication No.: US08282992B2Publication Date: 2012-10-09
- Inventor: Nyi Oo Myo , Kenric Cho , Shreyas Kher , Pravin Narwankar , Steve Poppe , Craig R. Metzner , Paul Deaten
- Applicant: Nyi Oo Myo , Kenric Cho , Shreyas Kher , Pravin Narwankar , Steve Poppe , Craig R. Metzner , Paul Deaten
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: C23C16/00
- IPC: C23C16/00

Abstract:
Embodiments of the invention provide methods for depositing materials on substrates during vapor deposition processes, such as atomic layer deposition (ALD). In one embodiment, a chamber contains a substrate support with a receiving surface and a chamber lid containing an expanding channel formed within a thermally insulating material. The chamber further includes at least one conduit coupled to a gas inlet within the expanding channel and positioned to provide a gas flow through the expanding channel in a circular direction, such as a vortex, a helix, a spiral, or derivatives thereof. The expanding channel may be formed directly within the chamber lid or formed within a funnel liner attached thereon. The chamber may contain a retaining ring, an upper process liner, a lower process liner or a slip valve liner. Liners usually have a polished surface finish and contain a thermally insulating material such as fused quartz or ceramic. In an alternative embodiment, a deposition system contains a catalytic water vapor generator connected to an ALD chamber.
Public/Granted literature
- US20080044569A1 METHODS FOR ATOMIC LAYER DEPOSITION OF HAFNIUM-CONTAINING HIGH-K DIELECTRIC MATERIALS Public/Granted day:2008-02-21
Information query
IPC分类: