Invention Grant
- Patent Title: Qualifying of a detector of noise peaks in the supply of an integrated circuit
- Patent Title (中): 合格的集成电路电源中的噪声峰值检测器
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Application No.: US11818691Application Date: 2007-06-15
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Publication No.: US08283931B2Publication Date: 2012-10-09
- Inventor: Alexandre Malherbe , Benjamin Duval
- Applicant: Alexandre Malherbe , Benjamin Duval
- Applicant Address: FR Montrouge
- Assignee: STMicroelectronics S.A.
- Current Assignee: STMicroelectronics S.A.
- Current Assignee Address: FR Montrouge
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: FR0652713 20060629
- Main IPC: G01R27/02
- IPC: G01R27/02
Abstract:
A method and a system for qualifying an integrated circuit according to a parasitic supply peak detector that it contains, including: supply of the integrated circuit to be tested under at least a first voltage; checking of a starting of the circuit; application of at least one first noise peak on the circuit power supply, while respecting an amplitude and time gauge; and comparison of average currents consumed by the circuit before and after the peak.
Public/Granted literature
- US20080012574A1 Qualifying of a detector of noise peaks in the supply of an integrated circuit Public/Granted day:2008-01-17
Information query
