发明授权
- 专利标题: Dual gate layout for thin film transistor
- 专利标题(中): 薄膜晶体管的双栅极布局
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申请号: US13348715申请日: 2012-01-12
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公开(公告)号: US08288774B2公开(公告)日: 2012-10-16
- 发明人: Wein-Town Sun , Chun-Sheng Li , Jian-Shen Yu
- 申请人: Wein-Town Sun , Chun-Sheng Li , Jian-Shen Yu
- 申请人地址: TW Hsinchu
- 专利权人: Au Optronics Corp.
- 当前专利权人: Au Optronics Corp.
- 当前专利权人地址: TW Hsinchu
- 代理机构: Thomas, Kayden, Horstemeyer & Risley, LLP
- 优先权: TW92107167A 20030328
- 主分类号: H01L29/10
- IPC分类号: H01L29/10 ; H01L29/76 ; H01L31/036 ; H01L31/112 ; H01L29/04 ; H01L31/0376 ; H01L31/20 ; H01L29/15 ; H01L29/47 ; H01L29/812 ; H01L31/07 ; H01L31/108
摘要:
A dual gate layout of a thin film transistor of liquid crystal display to alleviate dark current leakage is disclosed. The layout includes (1) a polysilicon on a substrate having a shaped of L- or of snake from top-view, having a heavily doped source region, a first lightly doped region, a first gate channel, a second lightly doped region, a second gate channel, a third lightly doped region and a heavily doped drain region formed in order therein; (2) a gate oxide layer formed on the poly-Si layer and the substrate, (3) a gate metal layer then formed on the gate oxide layer having a scanning line and an extension portion with a L-shaped or an I-shaped. The gate metal intersects with the poly-Si layer thereto define the forgoing gate channels. Among of gate channels, at least one is along the signal line through a source contact.
公开/授权文献
- US20120175627A1 Dual Gate Layout for Thin Film Transistor 公开/授权日:2012-07-12
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