发明授权
- 专利标题: Semiconductor device
- 专利标题(中): 半导体器件
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申请号: US12373185申请日: 2006-07-21
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公开(公告)号: US08319204B2公开(公告)日: 2012-11-27
- 发明人: Motoyasu Terao , Satoru Hanzawa , Takahiro Morikawa , Kenzo Kurotsuchi , Riichiro Takemura , Norikatsu Takaura , Nozomu Matsuzaki
- 申请人: Motoyasu Terao , Satoru Hanzawa , Takahiro Morikawa , Kenzo Kurotsuchi , Riichiro Takemura , Norikatsu Takaura , Nozomu Matsuzaki
- 申请人地址: JP Kanagawa
- 专利权人: Renesas Electronics Corporation
- 当前专利权人: Renesas Electronics Corporation
- 当前专利权人地址: JP Kanagawa
- 代理机构: Mattingly & Malur, PC
- 国际申请: PCT/JP2006/314457 WO 20060721
- 国际公布: WO2008/010290 WO 20080124
- 主分类号: H01L45/00
- IPC分类号: H01L45/00 ; H01L27/04
摘要:
A recording layer 52 made of a chalcogenide material which stores a high-resistance state of a high electrical resistance value and a low-resistance state of a low electrical resistance value is used as a memory element RM in a memory cell region, and it is formed so that a concentration of Ga or In of a first layer 52a positioned on a lower electrode TP side of the recording layer 52 is higher than the corresponding concentration of a second layer 52b positioned on an upper electrode 53 side. For example, the recording layer is formed so that a content of Ga or In of the second layer is 5 atomic % or more smaller than that of the first layer. Also, a circuit which can reverse the voltage polarity between the upper electrode and the lower electrode in a set operation and a reset operation is provided.
公开/授权文献
- US20100072451A1 SEMICONDUCTOR DEVICE 公开/授权日:2010-03-25
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