Invention Grant
- Patent Title: Test apparatus for measuring a characteristic of a device under test
- Patent Title (中): 用于测量被测设备的特性的测试装置
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Application No.: US12590955Application Date: 2009-11-16
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Publication No.: US08319503B2Publication Date: 2012-11-27
- Inventor: Kazuki Negishi , Mark Hansen
- Applicant: Kazuki Negishi , Mark Hansen
- Applicant Address: US OR Beaverton
- Assignee: Cascade Microtech, Inc.
- Current Assignee: Cascade Microtech, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: DASCENZO Intellectual Property Law, P.C.
- Main IPC: G01R29/26
- IPC: G01R29/26 ; G01R31/20
Abstract:
A flicker noise test system includes a guarded signal path and an unguarded signal path selectively connectable to respective terminals of a device under test. The selected signal path is connectable a terminal without disconnecting cables or changing probes.
Public/Granted literature
- US20100127714A1 Test system for flicker noise Public/Granted day:2010-05-27
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