发明授权
- 专利标题: Edge detection method for transparent substrate by detecting non-light-emitting region of transparent substrate
- 专利标题(中): 透明基板的非发光区域的边缘检测方法
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申请号: US12510591申请日: 2009-07-28
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公开(公告)号: US08339615B2公开(公告)日: 2012-12-25
- 发明人: Masayuki Dohi , Itsuko Sakai , Takayuki Sakai , Shunji Kikuchi , Takuto Inoue , Akihiro Hori , Masayuki Narita
- 申请人: Masayuki Dohi , Itsuko Sakai , Takayuki Sakai , Shunji Kikuchi , Takuto Inoue , Akihiro Hori , Masayuki Narita
- 申请人地址: JP Tokyo
- 专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人: Kabushiki Kaisha Toshiba
- 当前专利权人地址: JP Tokyo
- 代理机构: Turocy & Watson, LLP
- 优先权: JP2008-195017 20080729
- 主分类号: G01B11/00
- IPC分类号: G01B11/00 ; G01N21/00
摘要:
An edge detection method includes preparing a transparent substrate which includes a first main face having a first main region and a first peripheral region and a second main face having a second main region and a second peripheral region, the first peripheral region having an inclination angle of θa1 and the second peripheral region having an inclination angle of θa2, causing measuring light to enter the first peripheral region from a direction perpendicular to the first main region, detecting a non-emitting region where the measuring light is not emitted from the second peripheral region, and detecting an edge of the transparent substrate on the basis of the non-emitting region, wherein if a refractive index of the transparent substrate is n, the inclination angles θa1 and θa2satisfy the following expression: n×sin(θa1+θa2−arcsin(sin θa1/n))≧1.
公开/授权文献
- US20100027032A1 EDGE DETECTION METHOD 公开/授权日:2010-02-04
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