Invention Grant
- Patent Title: Apparatuses for atomic layer deposition
- Patent Title (中): 用于原子层沉积的装置
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Application No.: US11127753Application Date: 2005-05-12
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Publication No.: US08343279B2Publication Date: 2013-01-01
- Inventor: Nyi Oo Myo , Kenric Choi , Shreyas Kher , Pravin Narwankar , Steve Poppe , Craig R. Metzner , Paul Deaten
- Applicant: Nyi Oo Myo , Kenric Choi , Shreyas Kher , Pravin Narwankar , Steve Poppe , Craig R. Metzner , Paul Deaten
- Applicant Address: US CA Santa Clara
- Assignee: Applied Materials, Inc.
- Current Assignee: Applied Materials, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Patterson & Sheridan, LLP
- Main IPC: C23C16/00
- IPC: C23C16/00

Abstract:
Embodiments of the invention provide apparatuses and methods for depositing materials on substrates during vapor deposition processes, such as atomic layer deposition (ALD). In one embodiment, a chamber contains a substrate support with a receiving surface and a chamber lid containing an expanding channel formed within a thermally insulating material. The chamber further includes at least one conduit coupled to a gas inlet within the expanding channel and positioned to provide a gas flow through the expanding channel in a circular direction, such as a vortex, a helix, a spiral or derivatives thereof. The expanding channel may be formed directly within the chamber lid or formed within a funnel liner attached thereon. The chamber may contain a retaining ring, an upper process liner, a lower process liner or a slip valve liner. Liners usually have a polished surface finish and contain a thermally insulating material such as fused quartz or ceramic. In an alternative embodiment, a deposition system contains a catalytic water vapor generator connected to an ALD chamber.
Public/Granted literature
- US20050271812A1 Apparatuses and methods for atomic layer deposition of hafnium-containing high-k dielectric materials Public/Granted day:2005-12-08
Information query
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