发明授权
US08343820B2 Method for fabricating vertical channel type non-volatile memory device 有权
垂直通道型非易失性存储器件的制造方法

  • 专利标题: Method for fabricating vertical channel type non-volatile memory device
  • 专利标题(中): 垂直通道型非易失性存储器件的制造方法
  • 申请号: US12624966
    申请日: 2009-11-24
  • 公开(公告)号: US08343820B2
    公开(公告)日: 2013-01-01
  • 发明人: Young-Kyun Jung
  • 申请人: Young-Kyun Jung
  • 申请人地址: KR Gyeonggi-do
  • 专利权人: Hynix Semiconductor Inc.
  • 当前专利权人: Hynix Semiconductor Inc.
  • 当前专利权人地址: KR Gyeonggi-do
  • 代理机构: IP & T Group LLP
  • 优先权: KR10-2009-0084157 20090907
  • 主分类号: H01L21/00
  • IPC分类号: H01L21/00
Method for fabricating vertical channel type non-volatile memory device
摘要:
A method for fabricating a vertical channel type non-volatile memory device including a plurality of memory cells stacked along channels protruding from a substrate includes: alternately forming a plurality of first material layers and a plurality of second material layers over the substrate; forming a buffer layer over the substrate with the plurality of the first material layers and the plurality of the second material layers formed thereon; forming trenches by etching the buffer layer, the plurality of the second material layers, and the plurality of the first material layers; forming a material layer for channels over the substrate to fill the trenches; and forming the channels by performing a planarization process until a surface of the buffer layer is exposed.
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