发明授权
- 专利标题: Topologies and methodologies for AMS integrated circuit design
- 专利标题(中): AMS集成电路设计的拓扑和方法
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申请号: US11927720申请日: 2007-12-11
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公开(公告)号: US08347244B2公开(公告)日: 2013-01-01
- 发明人: Amir Alon , David Goren , Rachel Gordin , Betty Livshitz , Sherman Anatoly , Michael Zelikson
- 申请人: Amir Alon , David Goren , Rachel Gordin , Betty Livshitz , Sherman Anatoly , Michael Zelikson
- 申请人地址: US NY Armonk
- 专利权人: International Business Machines Corporation
- 当前专利权人: International Business Machines Corporation
- 当前专利权人地址: US NY Armonk
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
A tool for analog and mixed signal circuits includes a unit enabling a user to identify one or more critical interconnect lines in a chip architecture and one or more selectable, predefined topologies for said critical interconnect lines. Each topology includes one or more signal wires and a current return path. A majority of the electric field lines are contained within the boundary of the topology. The invention also includes a method for designing analog and mixed signal (AMS) integrated circuits (IC), including defining a chip architecture and a floor plan, identifying one or more critical interconnect lines and selecting pre-designed transmission line topologies for the critical interconnect lines.
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