Invention Grant
- Patent Title: Linear-carrier phase-mask interferometer
- Patent Title (中): 线性载波相位掩模干涉仪
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Application No.: US12856723Application Date: 2010-08-16
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Publication No.: US08351048B2Publication Date: 2013-01-08
- Inventor: James E. Millerd
- Applicant: James E. Millerd
- Applicant Address: US AZ Tucson
- Assignee: 4D Technology Corporation
- Current Assignee: 4D Technology Corporation
- Current Assignee Address: US AZ Tucson
- Agent Antonio R. Durando
- Main IPC: G01B9/02
- IPC: G01B9/02

Abstract:
A phase-difference sensor measures the spatially resolved difference in phase between orthogonally polarized reference and test wavefronts. The sensor is constructed as a linear-carrier phase-mask aligned to and imaged on a linear-carrier detector array. Mireau and Fizeau polarization interferometric objectives are implemented with a thin conductive wire grid optically coupled to the objective beam splitter.
Public/Granted literature
- US20100309476A1 LINEAR-CARRIER PHASE-MASK INTERFEROMETER Public/Granted day:2010-12-09
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