- 专利标题: Sample analyzer and sample analyzing method
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申请号: US12284271申请日: 2008-09-19
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公开(公告)号: US08366998B2公开(公告)日: 2013-02-05
- 发明人: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- 申请人: Yuji Wakamiya , Tomohiro Okuzaki , Hisato Takehara
- 申请人地址: JP
- 专利权人: Sysmex Corporation
- 当前专利权人: Sysmex Corporation
- 当前专利权人地址: JP
- 代理机构: Brinks Hofer Gilson & Lione
- 优先权: JP2007-243692 20070920
- 主分类号: G01N21/00
- IPC分类号: G01N21/00 ; G01N35/00
摘要:
A sample analyzer includes an order receiver for receiving an analyzing order of a sample having analyzing item information; an analyzing section for analyzing a sample according to the analyzing order received by the order receiver; a calculator for counting a first number of analyses by the analyzing section in a first counting period, and a second number of analyses by the analyzing section in a second counting period different from the first counting period; a selection receiver for receiving a selection of either one of the first counting period and the second counting period; an output section; and an output controller for outputting a number of analyses in the counting period received by the selection receiver to the output section based on the counted result by the calculator is disclosed. A sample analyzing method is also disclosed.
公开/授权文献
- US20090215184A1 Sample analyzer and sample analyzing method 公开/授权日:2009-08-27
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