发明授权
- 专利标题: Memory elements with voltage overstress protection
- 专利标题(中): 具有电压过载保护功能的存储器元件
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申请号: US12874152申请日: 2010-09-01
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公开(公告)号: US08369175B1公开(公告)日: 2013-02-05
- 发明人: Lin-Shih Liu , Andy L. Lee , Ping-Chen Liu , Irfan Rahim , Srinivas Perisetty
- 申请人: Lin-Shih Liu , Andy L. Lee , Ping-Chen Liu , Irfan Rahim , Srinivas Perisetty
- 申请人地址: US CA San Jose
- 专利权人: Altera Corporation
- 当前专利权人: Altera Corporation
- 当前专利权人地址: US CA San Jose
- 代理机构: Treyz Law Group
- 代理商 Jason Tsai
- 主分类号: G11C5/14
- IPC分类号: G11C5/14
摘要:
Integrated circuits may include memory elements that are provided with voltage overstress protection. One suitable arrangement of a memory cell may include a latch with two cross-coupled inverters. Each of the two cross-coupled inverters may be coupled between first and second power supply lines and may include a transistor with a gate that is connected to a separate power supply line. Another suitable memory cell arrangement may include three cross-coupled circuits. Two of the three circuits may be powered by a first positive power supply line, while the remaining circuit may be powered by a second positive power supply line. These memory cells may be used to provide an elevated positive static control signal and a lowered ground static control signal to a corresponding pass gate. These memory cells may include access transistors and read buffer circuits that are used during read/write operations.
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