发明授权
- 专利标题: Method and system for improved nickel silicide
- 专利标题(中): 改善硅化镍的方法和系统
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申请号: US12890100申请日: 2010-09-24
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公开(公告)号: US08372750B2公开(公告)日: 2013-02-12
- 发明人: Amitabh Jain , Peijun Chen , Jorge A. Kittl
- 申请人: Amitabh Jain , Peijun Chen , Jorge A. Kittl
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 Jacqueline J. Garner; Wade J. Brady, III; Frederick J. Telecky, Jr.
- 主分类号: H01L21/44
- IPC分类号: H01L21/44
摘要:
According to one embodiment of the invention, a method for nickel silicidation includes providing a substrate having a source region, a gate region, and a drain region, forming a source in the source region and a drain in the drain region, annealing the source and the drain, implanting, after the annealing the source and the drain, a heavy ion in the source region and the drain region, depositing a nickel layer in each of the source and drain regions, and heating the substrate to form a nickel silicide region in each of the source and drain regions by heating the substrate.
公开/授权文献
- US20110014768A1 METHOD AND SYSTEM FOR IMPROVED NICKEL SILICIDE 公开/授权日:2011-01-20
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