发明授权
- 专利标题: Method of detecting a topology of a reflective surface
- 专利标题(中): 检测反射面拓扑的方法
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申请号: US13356379申请日: 2012-01-23
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公开(公告)号: US08373865B2公开(公告)日: 2013-02-12
- 发明人: Onur Kilic , Michel J. F. Digonnet , Gordon S. Kino , Olav Solgaard
- 申请人: Onur Kilic , Michel J. F. Digonnet , Gordon S. Kino , Olav Solgaard
- 申请人地址: US CA Palo Alto
- 专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人: The Board of Trustees of the Leland Stanford Junior University
- 当前专利权人地址: US CA Palo Alto
- 代理机构: Knobbe, Martens, Olson & Bear LLP
- 主分类号: G01B11/02
- IPC分类号: G01B11/02 ; G01B9/02
摘要:
A method detects a topology of a reflective surface. The method includes providing an optical fiber positioned such that light emitted from the optical fiber is reflected by at least a portion of the reflective surface. The optical fiber and the portion of the reflective surface form an optical resonator having an optical resonance with a resonance lineshape. The method further includes emitting light from the optical fiber while the optical fiber is at a plurality of positions along the reflective surface. The light emitted from the optical fiber irradiates a corresponding plurality of portions of the reflective surface. The method further includes measuring a change of the resonance lineshape due to the irradiation of the plurality of portions of the reflective surface.
公开/授权文献
- US20120182557A1 METHOD OF DETECTING A TOPOLOGY OF A REFLECTIVE SURFACE 公开/授权日:2012-07-19
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