发明授权
US08378868B2 Systems and methods for analog to digital converter charge storage device measurement
有权
用于模数转换器电荷存储器件测量的系统和方法
- 专利标题: Systems and methods for analog to digital converter charge storage device measurement
- 专利标题(中): 用于模数转换器电荷存储器件测量的系统和方法
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申请号: US12939486申请日: 2010-11-04
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公开(公告)号: US08378868B2公开(公告)日: 2013-02-19
- 发明人: Umar Jameer Lyles , Bertan Bakkaloglu , Brian P. Lum-Shue-Chan
- 申请人: Umar Jameer Lyles , Bertan Bakkaloglu , Brian P. Lum-Shue-Chan
- 申请人地址: US TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: US TX Dallas
- 代理商 William B. Kempler; Wade J. Brady, III; Frederick J. Telecky, Jr.
- 主分类号: H03M3/00
- IPC分类号: H03M3/00 ; H02J7/00
摘要:
Systems and methods for analog to digital conversion charge storage device measurement are presented. In multi-cell charge storage device monitoring systems, accurate measurement of cell voltages is used for protection of the multi-cell device. The disclosed cell referenced solution converts the cell voltage to a digital representation referenced at the cell voltage. The digital representation referenced to the cell voltage is then level shifted to a ground referenced signal suitable for digital post processing. This processing may be used for fault detection of over-voltage, under-voltage, open cell, and similar fault conditions and cell capacity measurements. An example embodiment implements a sigma delta modulator to perform the signal transformation from analog to digital. The disclosed systems and methods may be differential and stackable for multiple cells.
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