发明授权
- 专利标题: Methods and circuits for triode region detection
- 专利标题(中): 三极管区域检测方法与电路
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申请号: US12111114申请日: 2008-04-28
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公开(公告)号: US08378957B2公开(公告)日: 2013-02-19
- 发明人: Hendrik Santo , Kien Vi , Dilip S
- 申请人: Hendrik Santo , Kien Vi , Dilip S
- 申请人地址: US CA San Jose
- 专利权人: Atmel Corporation
- 当前专利权人: Atmel Corporation
- 当前专利权人地址: US CA San Jose
- 代理机构: Fish & Richardson P.C.
- 主分类号: G09G3/36
- IPC分类号: G09G3/36
摘要:
The present invention relates to circuits and methods for detecting transistor operation in the triode region including a circuit for a transistor in a constant current source. The circuit comprises a detector having a first input, a second input, and an output. The first input of the detector is coupled to the source of the transistor and the second input of the detector is coupled to the set point terminal of the constant current source. The circuit also comprises a flag coupled to the detector output. The detector has parameters selected so that, when the voltage at the source of the transistor satisfies a reference condition, the output of the detector sets the flag. The reference condition is established relative to the voltage at the set point terminal of the constant current source and relative to the triode transition voltage of the transistor at a selected drain-source current.
公开/授权文献
- US20090267652A1 METHODS AND CIRCUITS FOR TRIODE REGION DETECTION 公开/授权日:2009-10-29
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