发明授权
US08384148B2 Method of making a floating gate non-volatile MOS semiconductor memory device with improved capacitive coupling
有权
制造具有改进的电容耦合的浮栅非易失性MOS半导体存储器件的方法
- 专利标题: Method of making a floating gate non-volatile MOS semiconductor memory device with improved capacitive coupling
- 专利标题(中): 制造具有改进的电容耦合的浮栅非易失性MOS半导体存储器件的方法
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申请号: US11317679申请日: 2005-12-22
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公开(公告)号: US08384148B2公开(公告)日: 2013-02-26
- 发明人: Paolo Tessariol , Roberto Bez , Marcello Mariani
- 申请人: Paolo Tessariol , Roberto Bez , Marcello Mariani
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Schwegman, Lundberg & Woessner, P.A.
- 优先权: EP04425936 20041222; EP04425937 20041222
- 主分类号: H01L29/788
- IPC分类号: H01L29/788
摘要:
A method of making a non-volatile MOS semiconductor memory device includes a formation step, in a semiconductor material substrate, of STI isolation regions (shallow trench isolation) filled by field oxide and of memory cells separated each other by said STI isolation regions. The memory cells include a gate electrode electrically isolated from said semiconductor material substrate by a first dielectric layer, and the gate electrode includes a floating gate self-aligned to the STI isolation regions. The method includes a formation phase of said floating gate exhibiting a substantially saddle shape including a concavity; the formation step of said floating gate includes a deposition step of a first conformal conductor material layer.
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