Invention Grant
- Patent Title: Parameter extraction using radio frequency signals
- Patent Title (中): 使用射频信号进行参数提取
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Application No.: US12646121Application Date: 2009-12-23
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Publication No.: US08395392B2Publication Date: 2013-03-12
- Inventor: Grigory Simin , Michael Shur , Remigijus Gaska
- Applicant: Grigory Simin , Michael Shur , Remigijus Gaska
- Applicant Address: US SC Columbia
- Assignee: Sensor Electronic Technology, Inc.
- Current Assignee: Sensor Electronic Technology, Inc.
- Current Assignee Address: US SC Columbia
- Agent John W. LaBatt
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G01R27/00 ; G01R27/04

Abstract:
A set of parameters of an evaluation structure are extracted by applying a radio frequency (RF) signal through a first capacitive contact and a second capacitive contact to the evaluation structure. Measurement data corresponding to an impedance of the evaluation structure is acquired while the RF signal is applied, and the set of parameters are extracted from the measurement data. In an embodiment, multiple pairs of capacitive contacts can be utilized to acquire measurement data. Each pair of capacitive contacts can be separated by a channel having a unique spacing.
Public/Granted literature
- US20100156442A1 PARAMETER EXTRACTION USING RADIO FREQUENCY SIGNALS Public/Granted day:2010-06-24
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