Invention Grant
- Patent Title: Video rate-enabling probes for atomic force microscopy
- Patent Title (中): 用于原子力显微镜的视频速率探测器
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Application No.: US13276173Application Date: 2011-10-18
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Publication No.: US08398867B2Publication Date: 2013-03-19
- Inventor: Chung Hoon Lee
- Applicant: Chung Hoon Lee
- Agency: The Marbury Law Group PLLC
- Main IPC: B44C1/22
- IPC: B44C1/22 ; C25F3/00
Abstract:
Method for producing a probe for atomic force microscopy with a silicon nitride cantilever and an integrated single crystal silicon tetrahedral tip with high resonant frequencies and low spring constants intended for high speed AFM imaging.
Public/Granted literature
- US20120090058A1 Video Rate-Enabling Probes for Atomic Force Microscopy Public/Granted day:2012-04-12
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