Invention Grant
US08409459B2 Hollow cathode device and method for using the device to control the uniformity of a plasma process
有权
空心阴极器件和使用该器件来控制等离子体工艺的均匀性的方法
- Patent Title: Hollow cathode device and method for using the device to control the uniformity of a plasma process
- Patent Title (中): 空心阴极器件和使用该器件来控制等离子体工艺的均匀性的方法
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Application No.: US12039236Application Date: 2008-02-28
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Publication No.: US08409459B2Publication Date: 2013-04-02
- Inventor: Kazuki Denpoh , Peter L G Ventzek , Lin Xu , Lee Chen
- Applicant: Kazuki Denpoh , Peter L G Ventzek , Lin Xu , Lee Chen
- Applicant Address: JP
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP
- Main IPC: H01L21/306
- IPC: H01L21/306

Abstract:
A chamber component configured to be coupled to a processing chamber is described. The chamber component comprises one or more adjustable gas passages through which a process gas is introduced to the process chamber. The adjustable gas passage may be configured to form a hollow cathode that creates a hollow cathode plasma in a hollow cathode region having one or more plasma surfaces in contact with the hollow cathode plasma. Therein, at least one of the one or more plasma surfaces is movable in order to vary the size of the hollow cathode region and adjust the properties of the hollow cathode plasma. Furthermore, one or more adjustable hollow cathodes may be utilized to adjust a plasma process for treating a substrate.
Public/Granted literature
- US20090218212A1 HOLLOW CATHODE DEVICE AND METHOD FOR USING THE DEVICE TO CONTROL THE UNIFORMITY OF A PLASMA PROCESS Public/Granted day:2009-09-03
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