Invention Grant
- Patent Title: Method for manufacturing a power semiconductor device
- Patent Title (中): 功率半导体器件的制造方法
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Application No.: US12731977Application Date: 2010-03-25
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Publication No.: US08415239B2Publication Date: 2013-04-09
- Inventor: Jan Vobecky , Munaf Rahimo
- Applicant: Jan Vobecky , Munaf Rahimo
- Applicant Address: CH Zürich
- Assignee: ABB Technology AG
- Current Assignee: ABB Technology AG
- Current Assignee Address: CH Zürich
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: EP09156116 20090325
- Main IPC: H01L21/22
- IPC: H01L21/22 ; H01L21/225 ; H01L21/265

Abstract:
An exemplary method is disclosed for manufacturing a power semiconductor device which has a first electrical contact on a first main side and a second electrical contact on a second main side opposite the first main side and at least a two-layer structure with layers of different conductivity types, and includes providing an n-doped wafer and creating a surface layer of palladium particles on the first main side. The wafer is irradiated on the first main side with ions. Afterwards, the palladium particles are diffused into the wafer at a temperature of not more than 750° C., by which diffusion a first p-doped layer is created. Then, the first and second electrical contacts are created. At least the irradiation with ions is performed through a mask.
Public/Granted literature
- US20100248462A1 METHOD FOR MANUFACTURING A POWER SEMICONDUCTOR DEVICE Public/Granted day:2010-09-30
Information query
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