发明授权
- 专利标题: MOS device with varying contact trench lengths
- 专利标题(中): 具有不同接触沟槽长度的MOS器件
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申请号: US13316365申请日: 2011-12-09
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公开(公告)号: US08450794B2公开(公告)日: 2013-05-28
- 发明人: Anup Bhalla , Xiaobin Wang , Ji Pan , Sung-Po Wei
- 申请人: Anup Bhalla , Xiaobin Wang , Ji Pan , Sung-Po Wei
- 申请人地址: BM
- 专利权人: Alpha & Omega Semiconductor Limited
- 当前专利权人: Alpha & Omega Semiconductor Limited
- 当前专利权人地址: BM
- 代理机构: Van Pelt, Yi & James LLP
- 主分类号: H01L29/76
- IPC分类号: H01L29/76 ; H01L29/94 ; H01L31/062 ; H01L31/113 ; H01L31/119
摘要:
A semiconductor device is formed on a semiconductor substrate. The device comprises a drain; an epitaxial layer overlaying the drain; a body disposed in the epitaxial layer, having a body top surface and a body bottom surface; a source embedded in the body, extending from the body top surface into the body; a first gate trench extending into the epitaxial layer; a first gate disposed in the first gate trench; an active region contact trench extending through the source and at least part of the body into the drain; an active region contact electrode disposed within the active region contact trench; a second gate trench extending into the epitaxial layer; a second gate disposed in the gate trench; a gate contact trench formed within the second gate; and a gate contact electrode disposed within the gate contact trench.
公开/授权文献
- US20120080751A1 MOS DEVICE WITH VARYING CONTACT TRENCH LENGTHS 公开/授权日:2012-04-05
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