Invention Grant
- Patent Title: Successive approximation analog to digital converter with capacitor mismatch calibration and method thereof
- Patent Title (中): 具有电容器失配校准的逐次逼近模数转换器及其方法
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Application No.: US13210229Application Date: 2011-08-15
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Publication No.: US08451151B2Publication Date: 2013-05-28
- Inventor: Jin-Fu Lin
- Applicant: Jin-Fu Lin
- Applicant Address: TW Tainan
- Assignee: Himax Technologies Limited
- Current Assignee: Himax Technologies Limited
- Current Assignee Address: TW Tainan
- Agency: Stout, Uxa, Buyan & Mullins, LLP
- Main IPC: H03M1/00
- IPC: H03M1/00

Abstract:
A capacitance mismatch calibrating method for a successive approximation register ADC which includes at least one array of capacitors is provided. The method includes the following steps: firstly, at least two compensating capacitors are configured. A capacitor from the array of capacitors is selected as a capacitor-under-test. Then, the terminal voltages on the terminals of the array of capacitors and on the terminals of the compensating capacitors are determined. A first comparison voltage is outputted based on the determined terminal voltages. Afterwards, a sequence of comparisons is controlled based on the first comparison voltage and a second comparison voltage to output a sequence of corresponding digital bits. Finally, a calibration value is calculated to calibrate the value of a capacitor-under-test according to the digital bits.
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