Invention Grant
- Patent Title: Measurement of critical dimension
- Patent Title (中): 关键尺寸的测量
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Application No.: US13174815Application Date: 2011-07-01
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Publication No.: US08456639B2Publication Date: 2013-06-04
- Inventor: Shankar Krishnan , Haiming Wang
- Applicant: Shankar Krishnan , Haiming Wang
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Luedeka Neely Group, P.C.
- Agent Rick Barnes
- Main IPC: G01N21/55
- IPC: G01N21/55 ; G01N21/00

Abstract:
A spectroscopic instrument for conducting multi-wavelength, multi-azimuth, multi-angle-of-incidence readings on a substrate, the instrument having a broadband light source for producing an illumination beam, an objective for directing the illumination onto the substrate at multiple azimuth angles and multiple angels-of-incidence simultaneously, thereby producing a reflection beam, an aperture plate having an illumination aperture and a plurality of collection apertures formed therein for selectively passing portions of the reflection beam having desired discreet combinations of azimuth angle and angle-of-incident, a detector for receiving the discreet combinations of azimuth angle and angle-of-incident and producing readings, and a processor for interpreting the readings.
Public/Granted literature
- US20130003068A1 Measurement of Critical Dimension Public/Granted day:2013-01-03
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