Invention Grant
- Patent Title: Composite contact for semiconductor device
- Patent Title (中): 半导体器件的复合接点
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Application No.: US11781302Application Date: 2007-07-23
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Publication No.: US08461631B2Publication Date: 2013-06-11
- Inventor: Grigory Simin , Michael Shur , Remigijus Gaska
- Applicant: Grigory Simin , Michael Shur , Remigijus Gaska
- Applicant Address: US SC Columbia
- Assignee: Sensor Electronic Technology, Inc.
- Current Assignee: Sensor Electronic Technology, Inc.
- Current Assignee Address: US SC Columbia
- Agency: LaBatt, LLC
- Main IPC: H01L21/336
- IPC: H01L21/336

Abstract:
A composite contact for a semiconductor device is provided. The composite contact includes a DC conducting electrode that is attached to a semiconductor layer in the device, and a capacitive electrode that is partially over the DC conducting electrode and extends beyond the DC conducting electrode. The composite contact provides a combined resistive-capacitive coupling to the semiconductor layer. As a result, a contact impedance is reduced when the corresponding semiconductor device is operated at high frequencies.
Public/Granted literature
- US20080203446A1 COMPOSITE CONTACT FOR SEMICONDUCTOR DEVICE Public/Granted day:2008-08-28
Information query
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