发明授权
- 专利标题: Ion detector
- 专利标题(中): 离子检测器
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申请号: US13192670申请日: 2011-07-28
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公开(公告)号: US08466413B2公开(公告)日: 2013-06-18
- 发明人: Masahiro Kotani , Takayuki Ohmura , Motohiro Suyama , Hiroshi Kobayashi
- 申请人: Masahiro Kotani , Takayuki Ohmura , Motohiro Suyama , Hiroshi Kobayashi
- 申请人地址: JP Hamamatsu-shi, Shizuoka
- 专利权人: Hamamatsu Photonics K.K.
- 当前专利权人: Hamamatsu Photonics K.K.
- 当前专利权人地址: JP Hamamatsu-shi, Shizuoka
- 代理机构: Drinker Biddle & Reath LLP
- 优先权: JPP2010-170608 20100729; JPP2011-148871 20110705
- 主分类号: H01J49/02
- IPC分类号: H01J49/02 ; H01J43/10
摘要:
An ion detector for detecting positive ions and negative ions, includes a housing provided with an ion entrance to make the positive ions and the negative ions enter, a conversion dynode which is disposed in the housing and to which a negative potential is applied, a scintillator which is disposed in the housing and has an electron incident surface which is opposed to the conversion dynode and into which secondary electrons emitted from the conversion dynode are made incident, a conductive layer which is formed on the electron incident surface and to which a positive potential is applied, and a photodetector which detects light emitted by the scintillator in response to incidence of the secondary electrons.
公开/授权文献
- US20120025085A1 ION DETECTOR 公开/授权日:2012-02-02
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