Invention Grant
- Patent Title: Ion detector
- Patent Title (中): 离子检测器
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Application No.: US13192670Application Date: 2011-07-28
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Publication No.: US08466413B2Publication Date: 2013-06-18
- Inventor: Masahiro Kotani , Takayuki Ohmura , Motohiro Suyama , Hiroshi Kobayashi
- Applicant: Masahiro Kotani , Takayuki Ohmura , Motohiro Suyama , Hiroshi Kobayashi
- Applicant Address: JP Hamamatsu-shi, Shizuoka
- Assignee: Hamamatsu Photonics K.K.
- Current Assignee: Hamamatsu Photonics K.K.
- Current Assignee Address: JP Hamamatsu-shi, Shizuoka
- Agency: Drinker Biddle & Reath LLP
- Priority: JPP2010-170608 20100729; JPP2011-148871 20110705
- Main IPC: H01J49/02
- IPC: H01J49/02 ; H01J43/10

Abstract:
An ion detector for detecting positive ions and negative ions, includes a housing provided with an ion entrance to make the positive ions and the negative ions enter, a conversion dynode which is disposed in the housing and to which a negative potential is applied, a scintillator which is disposed in the housing and has an electron incident surface which is opposed to the conversion dynode and into which secondary electrons emitted from the conversion dynode are made incident, a conductive layer which is formed on the electron incident surface and to which a positive potential is applied, and a photodetector which detects light emitted by the scintillator in response to incidence of the secondary electrons.
Public/Granted literature
- US20120025085A1 ION DETECTOR Public/Granted day:2012-02-02
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