- 专利标题: ESD protection circuit and ESD protection device thereof
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申请号: US12981521申请日: 2010-12-30
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公开(公告)号: US08467162B2公开(公告)日: 2013-06-18
- 发明人: Chang-Tzu Wang , Tien-Hao Tang , Kuan-Cheng Su
- 申请人: Chang-Tzu Wang , Tien-Hao Tang , Kuan-Cheng Su
- 申请人地址: TW Science-Based Industrial Park, Hsin-Chu
- 专利权人: United Microelectronics Corp.
- 当前专利权人: United Microelectronics Corp.
- 当前专利权人地址: TW Science-Based Industrial Park, Hsin-Chu
- 代理商 Winston Hsu; Scott Margo
- 主分类号: H02H3/20
- IPC分类号: H02H3/20 ; H02H9/04
摘要:
The ESD protection circuit is electrically connected between a first power rail and a second power rail, and includes an ESD protection device, a switching device electrically connected between the ESD protection device and a first power rail, and a low-pass filter electrically connected between the first power rail and the first switching device. The ESD protection device includes a BJT and a first resistor electrically connected between a base of the BJT and a first power rail. When no ESD event occurs, a potential of the base is larger than or equal to a potential of an emitter of the BJT. When the ESD event occurs, the potential of the base is smaller than the potential of the emitter.
公开/授权文献
- US20120170160A1 ESD protection circuit and ESD protection device thereof 公开/授权日:2012-07-05
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