Invention Grant
US08471565B2 System and method for output flux measurement of light emitting diode
有权
发光二极管输出通量测量的系统和方法
- Patent Title: System and method for output flux measurement of light emitting diode
- Patent Title (中): 发光二极管输出通量测量的系统和方法
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Application No.: US12876063Application Date: 2010-09-03
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Publication No.: US08471565B2Publication Date: 2013-06-25
- Inventor: Viet Nguyen Hoang , Pascal Bancken , Radu Surdeanu
- Applicant: Viet Nguyen Hoang , Pascal Bancken , Radu Surdeanu
- Applicant Address: NL Eindhoven
- Assignee: NXP B.V.
- Current Assignee: NXP B.V.
- Current Assignee Address: NL Eindhoven
- Priority: EP09169653 20090907
- Main IPC: G01R31/00
- IPC: G01R31/00
Abstract:
A method of estimating the output light flux of a light emitting diode, comprises applying a drive current waveform to the LED over a period of time comprising a testing period. The forward voltage across the LED is monitored during the testing period, and the output light flux is estimated as a function of changes in the forward voltage.
Public/Granted literature
- US20110080113A1 SYSTEM AND METHOD FOR OUTPUT FLUX MEASUREMENT OF A LIGHT EMITTING DIODE Public/Granted day:2011-04-07
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