发明授权
US08471565B2 System and method for output flux measurement of light emitting diode
有权
发光二极管输出通量测量的系统和方法
- 专利标题： System and method for output flux measurement of light emitting diode
- 专利标题（中）： 发光二极管输出通量测量的系统和方法
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申请号： US12876063申请日： 2010-09-03
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公开(公告)号： US08471565B2公开(公告)日： 2013-06-25
- 发明人: Viet Nguyen Hoang , Pascal Bancken , Radu Surdeanu
- 申请人： Viet Nguyen Hoang , Pascal Bancken , Radu Surdeanu
- 申请人地址： NL Eindhoven
- 专利权人： NXP B.V.
- 当前专利权人： NXP B.V.
- 当前专利权人地址： NL Eindhoven
- 优先权： EP09169653 20090907
- 主分类号： G01R31/00
- IPC分类号： G01R31/00
摘要：
A method of estimating the output light flux of a light emitting diode, comprises applying a drive current waveform to the LED over a period of time comprising a testing period. The forward voltage across the LED is monitored during the testing period, and the output light flux is estimated as a function of changes in the forward voltage.
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