发明授权
US08502612B2 Method and apparatus for determining within-die and across-die variation of analog circuits
有权
用于确定模拟电路的管芯内和模具间变化的方法和装置
- 专利标题: Method and apparatus for determining within-die and across-die variation of analog circuits
- 专利标题(中): 用于确定模拟电路的管芯内和模具间变化的方法和装置
-
申请号: US13197525申请日: 2011-08-03
-
公开(公告)号: US08502612B2公开(公告)日: 2013-08-06
- 发明人: Praveen Mosalikanti , Nasser A. Kurd , Timothy M. Wilson
- 申请人: Praveen Mosalikanti , Nasser A. Kurd , Timothy M. Wilson
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Blakely, Sokoloff, Taylor & Zafman LLP
- 主分类号: G01R23/02
- IPC分类号: G01R23/02 ; G01R27/00 ; H03K3/03
摘要:
Described herein is the method and apparatus for determining frequency of an oscillator coupled with one or more analog devices, and for determining within-die or across-die variations in an analog property associated with the one or more analog devices, the determining based on the oscillator frequency. The analog property includes output signal swing, bandwidth, offset, gain, and delay line linearity and range. The one or more analog devices include input-output (I/O) buffer, analog amplifier, and delay line. The method further comprises updating a simulation model file based on the determining of the within-die and/or across-die variations of the analog property.
公开/授权文献
信息查询