Invention Grant
- Patent Title: Ontology model to accelerate engineering analysis in manufacturing
- Patent Title (中): 本体模型加快制造业的工程分析
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Application No.: US12579269Application Date: 2009-10-14
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Publication No.: US08510254B2Publication Date: 2013-08-13
- Inventor: Ya-Jung Tsai , Chih-Min Fan , Shi-Chung Chang , Hsiu-Chieh Cheng , Fang-Hsiang Su , Wu-Chi Chen , Ching-Pin Kao
- Applicant: Ya-Jung Tsai , Chih-Min Fan , Shi-Chung Chang , Hsiu-Chieh Cheng , Fang-Hsiang Su , Wu-Chi Chen , Ching-Pin Kao
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: G05B13/04
- IPC: G05B13/04 ; G06F17/00
Abstract:
An engineering analysis tool comprises a unified resource model-based (URM) objective and tool mapping capability for linking engineering analysis objectives to analysis tools. A Markov chain-based analysis plan generator (APTG) for reusing engineering analysis plans may be included in the engineering analysis tool. Further, the engineering analysis tool comprises a graphic symptom capturer (GSC) that auto-captures engineering perceived fault symptoms from engineering data analysis (EDA) tools.
Public/Granted literature
- US20100174396A1 Ontology Model to Accelerate Engineering Analysis in Manufacturing Public/Granted day:2010-07-08
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