- 专利标题: Multi-layer three-dimensional structures having features smaller than a minimum feature size associated with the formation of individual layers
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申请号: US13323995申请日: 2011-12-13
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公开(公告)号: US08512861B2公开(公告)日: 2013-08-20
- 发明人: Michael S. Lockard , Adam L. Cohen , Vacit Arat , Dennis R. Smalley
- 申请人: Michael S. Lockard , Adam L. Cohen , Vacit Arat , Dennis R. Smalley
- 申请人地址: US CA Van Nuys
- 专利权人: Microfabrica Inc.
- 当前专利权人: Microfabrica Inc.
- 当前专利权人地址: US CA Van Nuys
- 代理商 Dennis R. Smalley
- 主分类号: B32B19/00
- IPC分类号: B32B19/00 ; B01D39/00
摘要:
Embodiments of multi-layer three-dimensional structures and formation methods provide structures with effective feature (e.g. opening) sizes (e.g. virtual gaps) that are smaller than a minimum feature size (MFS) that exists on each layer as a result of the formation method used in forming the structures. In some embodiments, multi-layer structures include a first element (e.g. first patterned layer with a gap) and a second element (e.g. second patterned layer with a gap) positioned adjacent the first element to define a third element (e.g. a net gap or opening resulting from the combined gaps of the first and second elements) where the first and second elements have features that are sized at least as large as the minimum feature size and the third element, at least in part, has dimensions or defines dimensions smaller than the minimum feature size.
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