发明授权
- 专利标题: Lithography system
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申请号: US12611847申请日: 2009-11-03
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公开(公告)号: US08525134B2公开(公告)日: 2013-09-03
- 发明人: Jan-Jaco Marco Wieland , Johannes Christiaan van 't Spijker , Remco Jager , Pieter Kruit
- 申请人: Jan-Jaco Marco Wieland , Johannes Christiaan van 't Spijker , Remco Jager , Pieter Kruit
- 申请人地址: NL
- 专利权人: Mapper Lithography IP B.V.
- 当前专利权人: Mapper Lithography IP B.V.
- 当前专利权人地址: NL
- 代理机构: Blakley Sokoloff Taylor & Zafman
- 主分类号: G21K5/10
- IPC分类号: G21K5/10 ; H01J37/147 ; G03B27/54 ; G03B27/72 ; G03F7/20 ; H01J37/317
摘要:
A maskless lithography system for transferring a pattern onto the surface of a target. At least one beam generator for generating a plurality of beamlets. A plurality of modulators modulate the magnitude of a beamlet, and a control unit controls of the modulators. The control unit generates and delivers pattern data to the modulators for controlling the magnitude of each individual beamlet. The control unit includes at least one data storage for storing the pattern data, at least one readout unit for reading out the data from the data storage, at least one data converter for converting the data that is read out from the data storage into at least one modulated light beam, and at least one optical transmitter for transmitting the at least one modulated light beam to the modulation modulators.
公开/授权文献
- US20100045958A1 LITHOGRAPHY SYSTEM 公开/授权日:2010-02-25
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