Invention Grant
US08532258B2 Method for determining the projection geometry of an x-ray apparatus
失效
用于确定x射线设备的投影几何形状的方法
- Patent Title: Method for determining the projection geometry of an x-ray apparatus
- Patent Title (中): 用于确定x射线设备的投影几何形状的方法
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Application No.: US13142043Application Date: 2010-10-06
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Publication No.: US08532258B2Publication Date: 2013-09-10
- Inventor: Clemens Bulitta , Rainer Graumann
- Applicant: Clemens Bulitta , Rainer Graumann
- Applicant Address: DE Munich
- Assignee: Siemens Aktiengesellschaft
- Current Assignee: Siemens Aktiengesellschaft
- Current Assignee Address: DE Munich
- Agency: Schiff Hardin LLP
- Priority: DE102009049818 20091019
- International Application: PCT/EP2010/064891 WO 20101006
- International Announcement: WO2011/047960 WO 20110428
- Main IPC: G01N23/04
- IPC: G01N23/04 ; G06K9/00
Abstract:
In a method for determining the projection geometry of an x-ray apparatus, an x-ray image of an object inside the patient is generated using the x-ray apparatus. A first measurement of a characteristic dimension of the imaged object is determined in the x-ray image. A second measurement of the characteristic dimension is determined using real geometry data of the object. The projection geometry is then determined using the first and second measurements.
Public/Granted literature
- US20110262024A1 METHOD FOR DETERMINING THE PROJECTION GEOMETRY OF AN X-RAY APPARATUS Public/Granted day:2011-10-27
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