发明授权
- 专利标题: Dual stage sensing for non-volatile memory
- 专利标题(中): 用于非易失性存储器的双级感测
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申请号: US13243814申请日: 2011-09-23
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公开(公告)号: US08537587B2公开(公告)日: 2013-09-17
- 发明人: Hai Li , Yiran Chen , Yuan Yan , Brian Lee , Ran Wang
- 申请人: Hai Li , Yiran Chen , Yuan Yan , Brian Lee , Ran Wang
- 申请人地址: US CA Scotts Valley
- 专利权人: Seagate Technology LLC
- 当前专利权人: Seagate Technology LLC
- 当前专利权人地址: US CA Scotts Valley
- 代理机构: Hall Estill Attorneys at Law
- 主分类号: G11C5/06
- IPC分类号: G11C5/06
摘要:
A method and apparatus for accessing a non-volatile memory cell. In some embodiments, a memory block provides a plurality of memory cells arranged into rows and columns. A read circuit is configured to read a selected row of the memory block by concurrently applying a control voltage to each memory cell along the selected row and, for each column, using a respective local sense amplifier and a column sense amplifier to successively differentiate a voltage across the associated memory cell in said column to output a programmed content of the row.
公开/授权文献
- US20120014168A1 Dual Stage Sensing for Non-Volatile Memory 公开/授权日:2012-01-19
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