A method of debugging within an integrated circuit (IC) that includes an embedded processor can include detecting an event within a circuit of the IC that is external to the processor and, responsive to detecting the event, initiating a debug function within the processor. Similarly, responsive to detecting an event within the processor, a debug function within a circuit block of the IC that is external to the processor can be initiated. Trace data generated within the processor and trace data generated within the programmable fabric further can be merged to generate combined trace data.