发明授权
- 专利标题: Semiconductor integrated circuit, operating method of semiconductor integrated circuit, and debug system
- 专利标题(中): 半导体集成电路,半导体集成电路的操作方法和调试系统
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申请号: US13014318申请日: 2011-01-26
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公开(公告)号: US08595562B2公开(公告)日: 2013-11-26
- 发明人: Takashi Sato , Toshiaki Saruwatari , Ken Ryu
- 申请人: Takashi Sato , Toshiaki Saruwatari , Ken Ryu
- 申请人地址: US CA Sunnyvale
- 专利权人: Spansion LLC
- 当前专利权人: Spansion LLC
- 当前专利权人地址: US CA Sunnyvale
- 代理机构: Sterne, Kessler, Goldstein & Fox P.L.L.C.
- 优先权: JP2010-127653 20100603
- 主分类号: G06F11/00
- IPC分类号: G06F11/00
摘要:
A current measurement unit measuring power supply currents each consumed in a plurality of circuit blocks of which at least one of the circuit blocks includes a processor, and outputting the measurement result as the power supply current values. A selection unit selecting at least one of the power supply current values according to selection information. A trace buffer sequentially holding the power supply current values being selected by the selection unit together with execution information of the processor, and sequentially outputting the held information. By selecting the power supply current values of the circuit blocks required for debugging according to the selection information, the number of external terminals of a semiconductor integrated circuit required for the debugging which includes tracing the power supply current values may be reduced. As a result, a chip size of the semiconductor integrated circuit with a debug function may be reduced.
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