发明授权
- 专利标题: Fuse circuit and semiconductor memory device including the same
- 专利标题(中): 保险丝电路和包括其的半导体存储器件
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申请号: US13205966申请日: 2011-08-09
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公开(公告)号: US08599635B2公开(公告)日: 2013-12-03
- 发明人: Jin-Ho Kim , Jong-Pil Son , Seong-Jin Jang , Byung-Sik Moon , Seung-Hoon Oh , Ju-Seop Park
- 申请人: Jin-Ho Kim , Jong-Pil Son , Seong-Jin Jang , Byung-Sik Moon , Seung-Hoon Oh , Ju-Seop Park
- 申请人地址: KR Suwon-si, Gyeonggi-do
- 专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人: Samsung Electronics Co., Ltd.
- 当前专利权人地址: KR Suwon-si, Gyeonggi-do
- 代理机构: Lee & Morse, P.C.
- 优先权: KR10-2010-0077102 20100811
- 主分类号: G11C17/18
- IPC分类号: G11C17/18
摘要:
A fuse circuit includes a program unit, a sensing unit and a control unit. The program unit is programmed in response to a program signal, and outputs a program output signal in response to a sensing enable signal. The sensing unit includes a variable resistor unit that has a resistance that varies based on a control signal, and generates a sensing output signal based on the resistance of the variable resistor unit and the program output signal. The control unit generates the control signal having a value changed depending on operation modes, and performs a verification operation with respect to the program unit based on the sensing output signal to generate a verification result. The program unit may be re-programmed based on the verification result.
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