Invention Grant
US08605383B1 Methods, devices and systems for characterizing polarities of piezoelectric (PZT) elements of a two PZT element microactuator
有权
用于表征两个PZT元件微致动器的压电（PZT）元件的极性的方法，装置和系统
- Patent Title: Methods, devices and systems for characterizing polarities of piezoelectric (PZT) elements of a two PZT element microactuator
- Patent Title (中): 用于表征两个PZT元件微致动器的压电（PZT）元件的极性的方法，装置和系统
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Application No.: US13476616Application Date: 2012-05-21
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Publication No.: US08605383B1Publication Date: 2013-12-10
- Inventor: Xin Wang , Yanning Liu
- Applicant: Xin Wang , Yanning Liu
- Applicant Address: US CA Irvine
- Assignee: Western Digital Technologies, Inc.
- Current Assignee: Western Digital Technologies, Inc.
- Current Assignee Address: US CA Irvine
- Main IPC: G11B21/02
- IPC: G11B21/02 ; G01R29/22
Abstract:
A method for characterizing polarities of piezoelectric (PZT) elements of a two-element PZT microactuator mechanically coupled to a structure may include calculating an impedance of the two PZT element microactuator over a predetermined frequency range; summing the calculated impedance over the predetermined frequency range; and characterizing the polarities of the PZT elements of the two PZT element microactuator as being different if the summed impedance is greater than a threshold value and as being the same if the summed impedance is less than or equal to the threshold value.
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