发明授权
US08636871B2 Plasma processing apparatus, plasma processing method and storage medium
有权
等离子体处理装置,等离子体处理方法和存储介质
- 专利标题: Plasma processing apparatus, plasma processing method and storage medium
- 专利标题(中): 等离子体处理装置,等离子体处理方法和存储介质
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申请号: US12523212申请日: 2007-12-27
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公开(公告)号: US08636871B2公开(公告)日: 2014-01-28
- 发明人: Ikuo Sawada , Peter Ventzek , Tatsuro Ohshita , Kazuyoshi Matsuzaki , Songyun Kang
- 申请人: Ikuo Sawada , Peter Ventzek , Tatsuro Ohshita , Kazuyoshi Matsuzaki , Songyun Kang
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Electron Limited
- 当前专利权人: Tokyo Electron Limited
- 当前专利权人地址: JP Tokyo
- 代理机构: Rothwell, Figg, Ernst & Manbeck, P.C.
- 优先权: JP2007-006206 20070115
- 国际申请: PCT/JP2007/075076 WO 20071227
- 国际公布: WO2008/087843 WO 20080724
- 主分类号: C23F1/00
- IPC分类号: C23F1/00 ; H01L21/306 ; C23C16/00
摘要:
A plasma processing apparatus includes a first electrode and a second electrode so arranged in the upper portion of a processing chamber as to face a mounting table, a gas supply unit for supplying a processing gas between the first electrode and the second electrode, a RF power supply unit for applying a RF power between the first electrode and the second electrode for converting the process gas supplied between the electrodes into a plasma, and a gas exhaust unit for evacuating the inside of the processing chamber to a vacuum level from the lower portion of the processing chamber. Since the electron temperature in the plasma is low near a substrate on the mounting table, damage to the substrate caused by the plasma can be suppressed. In addition, since a metal can be used as a material for the processing chamber, the processing chamber can have good temperature controllability.
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